LEMSYS is a ISO 9001:2000 certified company. Associated with the creation of the IEC 60747 standard, LEMSYS is, since 1972, the reference for dynamic and static parameter measurement of Power Semiconductors.

The main goal is to develop, produce and market high quality electronic measurement equipment, devoting particular attention to the customer's total satisfaction in the production of quality products while safeguarding the environment.

LEMSYS possesses a deep knowledge of power electronics, measuring techniques and the associated components: technical, technological and of the application in their specific environment of use.

TRd, TRs, TRds test equipment family
The equipment is designed to test IGBTs, MOSFETs and freewheeling Diodes from single chip to complex power modules and IPMs.
One of the key unique features of the equipment is its ability to make static, dynamic, avalanche and short-circuit tests, on the same test head, without removing or reconnecting the device under test.
Dynamic only version, static only version and both dynamic and static version are available.
The modular conception combined with the remote diagnostic feature, allow an optimisation of the system down time and an easy maintenance.

LEMSYSpro test equipment family
The equipment is designed for the production static tests of IGBT, MOSFET, Diode, Thyristors, Triac and others. Specially adapted for the production environment as single or multi station tester, the test heads can be integrated into handler systems. The output matrix allows high speed automatic test of the single devices of a complex power module without removing or reconnecting the module. Programmable output matrix connection.

Diode Measuring System DMS
The DMS equipment has been modularly designed to enable it to measure different dynamic parameters with a single rack.
The DMS is especially useful for component qualification, characterization and can also be used as a maintenance unit.
A set of plug-in modules is available to achieve the measurement of most dynamic switching parameters of the diodes

Thyristors & Diode dynamic test equipment family
Since 1972, LEMSYS equipments are the reference for the Thyristors and diode dynamic and static parameter measurements.
We have designed a full range of test equipments to satisfy the different customer's needs, for laboratory, production and maintenance.

MAINTENANCE AND LOW/MEDIUM PRODUCTION TEST EQUIPMENT

Portable test equipment TP0620
The portable tester TP0620 is designed for easy and fast functional control of the major power semiconductors in the lab or on site (IGBT, MOSFET, Diodes, Thyristors and other components).

• breakdown voltage VD-VR
• leakage current ID - IR
• forward voltage drop VF, VT

LEMSYS presses
The variety of power semi-conductor sizes and housings to be tested with reliable and low inductance connections is so important that LEMSYS has designed a complete range of presses to facilitate the connection of the semi-conductor to the measurement equipment. Thanks to its conception based on an electric motor, this clamping device responds to the clean room requirements. Furthermore thanks to its automatic door and its general ergonomics, a highly efficient production instrument. Several types of adapters are offered for press-pack device (hockey puck) and chips, as well as customized adapters responding to specific requirements. Because of its high voltage withstand and its low inductance, this equipment permits connection to both a tester measuring the static parameters as well as the dynamic parameters of semi-conductors. A close fitting heating unit permits handling of a wide range of test conditions.